| 发明名称 |
Selecting a survey setting for characterizing a target structure |
| 摘要 |
Complex-valued sensitivity data structures corresponding to respective candidate survey settings are provided, where the sensitivity data structures relate measurement data associated with a target structure to at least one parameter of a model of the target structure. Based on the sensitivity data structures, a subset of the candidate survey settings is selected according to a criterion for enhancing resolution in characterizing the target structure. |
| 申请公布号 |
US9146330(B2) |
申请公布日期 |
2015.09.29 |
| 申请号 |
US201213421731 |
申请日期 |
2012.03.15 |
| 申请人 |
WesternGeco L.L.C. |
发明人 |
Djikpesse Hugues A.;Prange Michael David;Khodja Mohamed-Rabigh;Duchenne Sebastien;Menkiti Henry |
| 分类号 |
G01V1/28;G01V1/30 |
主分类号 |
G01V1/28 |
| 代理机构 |
|
代理人 |
Bukoye Abimbola |
| 主权项 |
1. A method comprising:
calculating complex-valued sensitivity data structures corresponding to respective candidate survey settings, wherein the sensitivity data structures relate measurement data associated with a target structure to at least one parameter of a model of the target structure; selecting, based on the sensitivity data structures, a subset of the candidate survey settings according to a criterion for enhancing resolution in characterizing the target structure; and configuring survey equipment according to at least one survey setting in the subset of the candidate survey settings to perform a survey operation of the target structure. |
| 地址 |
Houston TX US |
