发明名称 |
Nonvolatile semiconductor memory device and method for manufacturing same |
摘要 |
A nonvolatile semiconductor memory device, includes: a stacked structural unit including a plurality of insulating films alternately stacked with a plurality of electrode films in a first direction; a selection gate electrode stacked on the stacked structural unit in the first direction; an insulating layer stacked on the selection gate electrode in the first direction; a first semiconductor pillar piercing the stacked structural unit, the selection gate electrode, and the insulating layer in the first direction, a first cross section of the first semiconductor pillar having an annular configuration, the first cross section being cut in a plane orthogonal to the first direction; a first core unit buried in an inner side of the first semiconductor pillar, the first core unit being recessed from an upper face of the insulating layer; and a first conducting layer of the first semiconductor pillar provided on the first core unit to contact the first core unit. |
申请公布号 |
US9147575(B2) |
申请公布日期 |
2015.09.29 |
申请号 |
US201414150504 |
申请日期 |
2014.01.08 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Fukuzumi Yoshiaki;Katsumata Ryota;Kito Masaru;Kidoh Masaru;Tanaka Hiroyasu;Komori Yosuke;Ishiduki Megumi;Matsunami Junya;Fujiwara Tomoko;Aochi Hideaki;Kirisawa Ryouhei;Mikajiri Yoshimasa;Oota Shigeto |
分类号 |
H01L29/792;H01L21/223;H01L27/115;H01L29/66;H01L21/265;H01L29/78 |
主分类号 |
H01L29/792 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A nonvolatile semiconductor memory device, comprising:
a stacked structural unit including a plurality of insulating films alternately stacked with a plurality of electrode films in a first direction; a selection gate electrode stacked above the stacked structural unit in the first direction; an insulating layer stacked on the selection gate electrode in the first direction; a first semiconductor pillar piercing the stacked structural unit, the selection gate electrode, and the insulating layer in the first direction; a first core insulating unit extending in the first direction, the first semiconductor pillar being disposed between the first core insulating unit and the stacked structural unit, a position of an upper end of the first core insulating unit in the first direction being located between a position of an upper end of the insulating layer in the first direction and a position of an upper end of the selection gate electrode in the first direction; and a first conducting layer provided on the first core insulating unit to contact the first core insulating unit. |
地址 |
Minato-ku JP |