发明名称 |
Dual comparator-based error correction scheme for analog-to-digital converters |
摘要 |
An analog-to-digital converter (ADC) includes a first comparator, a second comparator, and a decision timing comparison logic unit. The first comparator is configured to output a first output voltage and the second comparator is configured to output a second output voltage during a same binary algorithmic iteration of the ADC. The decision timing comparison logic unit is configured to identify a first polarity of the first output voltage and a second polarity of the second output voltage and, if the first polarity is equivalent to a second polarity, to insert at least one redundant capacitor for a next binary algorithmic iteration of the ADC. |
申请公布号 |
US9148159(B1) |
申请公布日期 |
2015.09.29 |
申请号 |
US201414209813 |
申请日期 |
2014.03.13 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Sharma Ajit;Lee Seung Bae;Ramaswamy Srinath M.;Narayanan Sriram;Polley Arup |
分类号 |
H03M1/06;H03M1/12;H03M1/36;H03M1/44;H03M1/00 |
主分类号 |
H03M1/06 |
代理机构 |
|
代理人 |
Pessetto John R.;Brill Charles A.;Cimino Frank D. |
主权项 |
1. A method comprising:
sampling a first output voltage of a first comparator and a second output voltage of a second comparator during a same binary algorithmic iteration of an analog-to-digital converter (ADC); identifying a first polarity of the first output voltage and a second polarity of the second output voltage; and if the first polarity is equal to the second polarity, inserting at least one redundant capacitor for a next binary algorithmic iteration of the ADC. |
地址 |
Dallas TX US |