发明名称 TEST DEVICE AND CONNECTION UNIT
摘要 <p>PROBLEM TO BE SOLVED: To perform testing of a device under test under conditions that are close to those of actual operation at low cost.SOLUTION: A test device for performing testing of a device under test includes: an interposer to which the device under test is detachably connected; a testing device fixed to the interposer; and a testing unit that is connected to the interposer and inputs a test signal to the device under test without going through the testing device. The testing device operates according to a signal which is output by the device under test.</p>
申请公布号 JP2015169645(A) 申请公布日期 2015.09.28
申请号 JP20140047238 申请日期 2014.03.11
申请人 ADVANTEST CORP 发明人 MATSUMURA HIDENOBU
分类号 G01R31/26 主分类号 G01R31/26
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