发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method including a laser annealing process capable of inhibiting the occurrence of surface roughness and activating dopant in a deep region.SOLUTION: A semiconductor device manufacturing method comprises the steps of: injecting a first dopant into a surface layer of an IGBT zone of a semiconductor substrate to form a first injection region; injecting a second dopant into a region shallower than the first injection region to form a second injection region; injecting a third dopant into a surface layer of a diode zone at a concentration higher than that of the second dopant to form an amorphous third injection region; subsequently performing laser annealing on the IGBT zone and the diode zone under a condition of partially melting the third injection region and activating the first dopant; and subsequently annealing the IGBT zone and the diode zone by pulse laser beams with a short pulse width to melt and crystallize a surface layer shallower than the second injection region over a whole area of the IGBT zone and the diode zone. |
申请公布号 |
JP2015170724(A) |
申请公布日期 |
2015.09.28 |
申请号 |
JP20140044494 |
申请日期 |
2014.03.07 |
申请人 |
SUMITOMO HEAVY IND LTD |
发明人 |
SUZUKI TAKEOMI;SAKAMOTO MASAKI |
分类号 |
H01L29/739;H01L21/265;H01L21/336;H01L27/04;H01L29/78 |
主分类号 |
H01L29/739 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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