发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method including a laser annealing process capable of inhibiting the occurrence of surface roughness and activating dopant in a deep region.SOLUTION: A semiconductor device manufacturing method comprises the steps of: injecting a first dopant into a surface layer of an IGBT zone of a semiconductor substrate to form a first injection region; injecting a second dopant into a region shallower than the first injection region to form a second injection region; injecting a third dopant into a surface layer of a diode zone at a concentration higher than that of the second dopant to form an amorphous third injection region; subsequently performing laser annealing on the IGBT zone and the diode zone under a condition of partially melting the third injection region and activating the first dopant; and subsequently annealing the IGBT zone and the diode zone by pulse laser beams with a short pulse width to melt and crystallize a surface layer shallower than the second injection region over a whole area of the IGBT zone and the diode zone.
申请公布号 JP2015170724(A) 申请公布日期 2015.09.28
申请号 JP20140044494 申请日期 2014.03.07
申请人 SUMITOMO HEAVY IND LTD 发明人 SUZUKI TAKEOMI;SAKAMOTO MASAKI
分类号 H01L29/739;H01L21/265;H01L21/336;H01L27/04;H01L29/78 主分类号 H01L29/739
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