发明名称 DISPLACEMENT MEASURING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a displacement measuring device which can measure a displacement of a structure for each direction, and is advantageous for miniaturization of a device scale.SOLUTION: A displacement measuring device is includes: a target 104 having a rear surface 104a which is a flat surface, and a front surface 104b parallel to the rear surface 104a, and having a plurality of reflection surfaces 204 arranged in a surface direction parallel to the rear surface 104a; a laser light irradiation device 105 which irradiates light having an optical axis orthogonal to the reflection surfaces 204 toward the front surface 104b; and a CCD image sensor 103 having a light receiving surface 103a for receiving reflected light of light reflected on the reflection surfaces 204, and which detects intensities and light receiving timings of the respective pieces of reflected light when a plurality of pieces of reflected light are received in different timings within a range of preset time on the light receiving surface 103a. Then, the target 104 is fixed to a ceiling surface 102, and the laser light irradiation device 105 is fixed to a floor slab surface 101.</p>
申请公布号 JP2015169475(A) 申请公布日期 2015.09.28
申请号 JP20140043075 申请日期 2014.03.05
申请人 TAISEI CORP 发明人 IGARASHI SAYAKA
分类号 G01B11/00;G01B11/16 主分类号 G01B11/00
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