发明名称 |
III-NITRIDE DEVICE AND METHOD HAVING A GATE ISOLATING STRUCTURE |
摘要 |
A semiconductor device containing a GaN FET has an isolating gate structure outside the channel area which is operable to block current in the two-dimensional electron gas between two regions of the semiconductor device. The isolating gate structure is formed concurrently with the gate of the GaN FET, and has a same structure as the gate. |
申请公布号 |
US2015270357(A1) |
申请公布日期 |
2015.09.24 |
申请号 |
US201514731744 |
申请日期 |
2015.06.05 |
申请人 |
Texas Instruments Incorporated |
发明人 |
PENDHARKAR Sameer;TIPIRNENI Naveen;JOH Jungwoo |
分类号 |
H01L29/20;H01L27/085;H01L29/66;H01L29/778 |
主分类号 |
H01L29/20 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a substrate comprising gallium nitride; an low-defect layer of gallium nitride disposed on said substrate; a barrier layer of aluminum gallium nitride disposed on said low-defect layer; a gallium nitride field effect transistor (GaN FET), comprising:
a gate disposed over said barrier layer;a drain contact disposed over said low-defect layer; anda source contact disposed over said low-defect layer; and a first gate isolating structure and a second gate isolating structure disposed over said barrier layer having a same structure as said gate, said first gate isolating structure being located between a first region of said semiconductor device and a second region of said semiconductor device and said second gate isolating structure being located between the first region of the semiconductor device and a third region of the semiconductor device, wherein said first gate isolating structure is contiguous with said gate and said second gate isolating structure is separate from said gate. |
地址 |
Dallas TX US |