发明名称 III-NITRIDE DEVICE AND METHOD HAVING A GATE ISOLATING STRUCTURE
摘要 A semiconductor device containing a GaN FET has an isolating gate structure outside the channel area which is operable to block current in the two-dimensional electron gas between two regions of the semiconductor device. The isolating gate structure is formed concurrently with the gate of the GaN FET, and has a same structure as the gate.
申请公布号 US2015270357(A1) 申请公布日期 2015.09.24
申请号 US201514731744 申请日期 2015.06.05
申请人 Texas Instruments Incorporated 发明人 PENDHARKAR Sameer;TIPIRNENI Naveen;JOH Jungwoo
分类号 H01L29/20;H01L27/085;H01L29/66;H01L29/778 主分类号 H01L29/20
代理机构 代理人
主权项 1. A semiconductor device, comprising: a substrate comprising gallium nitride; an low-defect layer of gallium nitride disposed on said substrate; a barrier layer of aluminum gallium nitride disposed on said low-defect layer; a gallium nitride field effect transistor (GaN FET), comprising: a gate disposed over said barrier layer;a drain contact disposed over said low-defect layer; anda source contact disposed over said low-defect layer; and a first gate isolating structure and a second gate isolating structure disposed over said barrier layer having a same structure as said gate, said first gate isolating structure being located between a first region of said semiconductor device and a second region of said semiconductor device and said second gate isolating structure being located between the first region of the semiconductor device and a third region of the semiconductor device, wherein said first gate isolating structure is contiguous with said gate and said second gate isolating structure is separate from said gate.
地址 Dallas TX US