发明名称 METHOD OF MANUFACTURING WAFER LEVEL PACKAGE, WAFER LEVEL PACKAGE, AND WAFER CUTTING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a method of manufacturing a wafer level package, in which occurrence of poor appearance and deterioration of optical performance can be suppressed and reduction in the number of chips to be extracted from a wafer can also be suppressed.SOLUTION: A method of manufacturing a wafer level package includes: a first step for joining a plurality of wafers by pressing a pedestal part (2) which is provided adjacent to the optical surface equipped by a wafer (1) located on the uppermost surface and the lowermost surface out of the plurality of wafers; a second step for shaving off the pedestal part (2); and a third step for separating the wafers into a plurality of wafer level packages after the second step.</p>
申请公布号 JP2015167202(A) 申请公布日期 2015.09.24
申请号 JP20140041691 申请日期 2014.03.04
申请人 RICOH CO LTD 发明人 MAE KATSUTOMO;ANDO YUICHI;SATO YUKITO
分类号 H01L27/14;H01L21/301;H01L23/12 主分类号 H01L27/14
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