发明名称 |
METHOD OF MANUFACTURING WAFER LEVEL PACKAGE, WAFER LEVEL PACKAGE, AND WAFER CUTTING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method of manufacturing a wafer level package, in which occurrence of poor appearance and deterioration of optical performance can be suppressed and reduction in the number of chips to be extracted from a wafer can also be suppressed.SOLUTION: A method of manufacturing a wafer level package includes: a first step for joining a plurality of wafers by pressing a pedestal part (2) which is provided adjacent to the optical surface equipped by a wafer (1) located on the uppermost surface and the lowermost surface out of the plurality of wafers; a second step for shaving off the pedestal part (2); and a third step for separating the wafers into a plurality of wafer level packages after the second step.</p> |
申请公布号 |
JP2015167202(A) |
申请公布日期 |
2015.09.24 |
申请号 |
JP20140041691 |
申请日期 |
2014.03.04 |
申请人 |
RICOH CO LTD |
发明人 |
MAE KATSUTOMO;ANDO YUICHI;SATO YUKITO |
分类号 |
H01L27/14;H01L21/301;H01L23/12 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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