发明名称 PATTERN PLACEMENT ERROR AWARE OPTIMIZATION
摘要 Disclosed herein is a computer-implemented method to improve a lithographic process for imaging a portion of a design layout onto a substrate using a lithographic projection apparatus, the method comprising: computing a multi-variable cost function of a plurality of design variables that are characteristics of the lithographic process, and reconfiguring the characteristics of the lithographic process by adjusting the design variables until a predefined termination condition is satisfied. The multi-variable cost function may be a function of one or more pattern shift errors. Reconfiguration of the characteristics may be under one or more constraints on the one or more pattern shift errors.
申请公布号 WO2015139951(A1) 申请公布日期 2015.09.24
申请号 WO2015EP54448 申请日期 2015.03.03
申请人 ASML NETHERLANDS B.V. 发明人 HSU, DUAN-FU, STEPHEN;JIA, JIANJUN;LIU, XIAOFENG;ZHANG, YOUPING
分类号 G03F7/20;G03F1/36 主分类号 G03F7/20
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