| 发明名称 |
MULTI-WIRE ELECTRICAL PARAMETER MEASUREMENTS VIA TEST PATTERNS |
| 摘要 |
A measurement task is selected, where the measurement task is associated with a transmission of an encoded signal transmitted via a plurality of data lines. The encoded signal is encoded using one or more of 3-Phase, N-Phase, or N-factorial low-voltage differential signaling (LVDS) where N is at least three (3). A repeating waveform is generated corresponding to the measurement task. The repeating waveform corresponding to the measurement task is then transmitted via the plurality of data lines. |
| 申请公布号 |
US2015271037(A1) |
申请公布日期 |
2015.09.24 |
| 申请号 |
US201514666018 |
申请日期 |
2015.03.23 |
| 申请人 |
QUALCOMM Incorporated |
发明人 |
Wiley George Alan |
| 分类号 |
H04L12/26;G01R31/317;H04B1/10;G01R31/319 |
主分类号 |
H04L12/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method, comprising:
selecting a measurement task associated with a transmission of an encoded signal transmitted via a plurality of data lines, wherein the encoded signal is encoded using one or more of 3-Phase, N-Phase, or N-factorial low-voltage differential signaling (LVDS) where N is at least three (3); generating a repeating waveform corresponding to the measurement task; and transmitting the repeating waveform corresponding to the measurement task via the plurality of data lines. |
| 地址 |
San Diego CA US |
