SYSTEM FOR CALCULATION OF MATERIAL PROPERTIES USING REFLECTION TERAHERTZ RADIATION AND AN EXTERNAL REFERENCE STRUCTURE

摘要

A system for interpreting terahertz radiation includes a terahertz transmitter configured to output a pulse of terahertz radiation and a terahertz receiver configured to receive at least a portion of the pulse of radiation from the terahertz transmitter. The terahertz receiver is configured to output a signal based on the radiation received by the terahertz receiver.

主权项

1. A system for interpreting terahertz radiation, the system comprising:
a terahertz transmitter configured to output a pulse of terahertz radiation through a first port; a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation through the first port, wherein the terahertz receiver is configured to output a signal based on the radiation received by the terahertz receiver; a first optical interface providing optical interference to the pulse of terahertz radiation, wherein the first optical interface will reflect a first optical interface reflected portion of the pulse of terahertz radiation to the terahertz receiver; a second optical interface providing optical interference to the pulse of terahertz radiation, wherein the second optical interface will reflect a second optical interface reflected portion of the pulse of terahertz radiation to the terahertz receiver; a spacing being defined between the first optical interface and the second optical interface, the spacing being configured to receive a sample to be irradiated by at least a portion of the pulse of terahertz radiation; wherein the sample will reflect a first sample reflected portion of the pulse of terahertz radiation to the terahertz receiver and a second sample reflected portion of the pulse of terahertz radiation to the terahertz receiver; wherein terahertz transmitter and terahertz receiver are disposed substantially adjacent to one another in a housing; and a processor in communication with the terahertz receiver and configured to receive the signal from the terahertz receiver, the processor being configured to determine caliper thickness, density, index of refraction or mass of the sample based on the signal.