| 发明名称 |
CONDUCTED TYPE CURRENT PROBE |
| 摘要 |
A conducted type current probe is provided herein and comprises a plurality of first resistors, at least one second resistor, a first connective port, and a second connective port. The first resistors are connected in parallel to form a resistor with 1Ω resistance value, and the resistance value of the second resistor is 49Ω. The first resistors and the second resistor are connected. The first connective port is connected with a test end of a test Integrated Circuit (IC), and the second connective port is connected with a test receiver by a coaxial cable. |
| 申请公布号 |
US2015268272(A1) |
申请公布日期 |
2015.09.24 |
| 申请号 |
US201414264503 |
申请日期 |
2014.04.29 |
| 申请人 |
National Applied Research Laboratories |
发明人 |
CHANG Yin-Cheng;CHANG Da-Chiang |
| 分类号 |
G01R1/067;G01R1/20 |
主分类号 |
G01R1/067 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A conducted type current probe, comprising:
a plurality of first resistors connected in parallel to form a resistor with 1Ω resistance value; at least one second resistor including 49Ω resistance value and connected with the first resistors; a first connective port connected with a test point of a test integrated circuit (IC); and a second connective port connected with a test receiver by a coaxial cable. |
| 地址 |
Hsinchu City TW |
