发明名称 |
FINFET devices having a body contact and methods of forming the same |
摘要 |
Fin field-effect transistor devices and methods of forming the fin field-effect transistor devices are provided herein. In an embodiment, a fin field-effect transistor device includes a semiconductor substrate that has a fin. A gate electrode structure overlies the fin. Source and drain halo and/or extension regions and epitaxially-grown source regions and drain regions are formed in the fin and are disposed adjacent to the gate electrode structure. A body contact is disposed on a contact surface of the fin, and the body contact is spaced separately from the halo and/or extension regions and the epitaxially-grown source regions and drain regions. |
申请公布号 |
US9142674(B2) |
申请公布日期 |
2015.09.22 |
申请号 |
US201414176767 |
申请日期 |
2014.02.10 |
申请人 |
GLOBALFOUNDRIES, INC. |
发明人 |
Liu Yanxiang;Hargrove Michael;Gruensfelder Christian |
分类号 |
H01L29/78;H01L29/66 |
主分类号 |
H01L29/78 |
代理机构 |
Ingrassia Fisher & Lorenz, P.C. |
代理人 |
Ingrassia Fisher & Lorenz, P.C. |
主权项 |
1. A fin field-effect transistor device comprising:
a semiconductor substrate having a fin; a gate electrode structure overlying the fin; first sidewall spacers disposed on sidewalls of the gate electrode structure; source and drain halo and/or extension regions and epitaxially-grown source regions and drain regions formed in or on the fin and disposed adjacent to the gate electrode structure; and a body contact disposed on a contact surface of the fin, wherein the body contact is spaced separately from the halo and/or extension regions and the epitaxially-grown source regions and drain regions; a contact insulating layer disposed over the fin, between the body contact and the halo and/or extension regions; and a contact capping layer disposed over the body contact and the contact insulating layer. |
地址 |
Grand Cayman KY |