发明名称 Method for adjusting an optical system of a microlithographic projection exposure apparatus
摘要 A method for adjusting an optical system in a microlithographic projection exposure apparatus includes establishing, for a given actual position of a polarization-influencing component, a distribution of IPS values in a pupil plane of the projection exposure apparatus. Each IPS value denotes the degree of realization of a predetermined polarization state for a light ray reflected at a respective mirror element of the mirror arrangement. The method also includes changing the position of the polarization-influencing component on the basis of the established distribution.
申请公布号 US9140994(B2) 申请公布日期 2015.09.22
申请号 US201414458423 申请日期 2014.08.13
申请人 Carl Zeiss SMT GmbH 发明人 Saenger Ingo;Trauter Bastian
分类号 G03B27/72;G03B27/54;G03F7/20;G02B26/08;G02B27/28 主分类号 G03B27/72
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. A method of adjusting an optical system in a microlithographic projection exposure apparatus, wherein: the optical system comprises: a mirror arrangement comprising a plurality of mirror elements which are adjustable independently from one another to change an angular distribution of light reflected by the mirror arrangement; anda polarization-influencing optical arrangement comprising a polarization-influencing component configured so that displacing the polarization-influencing component varies a degree of overlap between the polarization-influencing component and the mirror arrangement; and the method comprises: a) establishing, for a given actual position of the polarization-influencing component, a distribution of IPS values in a pupil plane of the projection exposure apparatus, each IPS value denoting a degree of realization of a predetermined polarization state for a light ray reflected at a respective mirror element of the mirror arrangement; andb) changing the position of the polarization-influencing component based on the distribution established in a).
地址 Oberkochen DE