主权项 |
1. A semiconductor MP wafer process, comprising:
processing an MP wafer with a first process step; defining a wafer zone-1 and a wafer zone-2 of the MP wafer; processing the wafer zone-1 of the MP wafer with a second process step-1 and processing the wafer zone-2 of the MP wafer with a second process step-2, wherein the second process step-1 and the second process step-2, respectively, forming different semiconductor device components on the wafer zone-1 and the wafer zone-2 of the MP wafer, and wherein the second process step-1 and the second process step-2 are processed after the first process step is completed; and processing the MP wafer with a subsequent process to fabricate a finished MP wafer, wherein after the subsequent process is completed, the wafer zone-1 and the wafer zone-2 are not destroyed. |