发明名称 |
Method of growing nitride semiconductor layer, nitride semiconductor device, and method of fabricating the same |
摘要 |
Exemplary embodiments of the present invention provide a method of growing a nitride semiconductor layer including growing a gallium nitride-based defect dispersion suppressing layer on a gallium nitride substrate including non-defect regions and a defect region disposed between the non-defect regions, and growing a gallium nitride semiconductor layer on the defect dispersion suppressing layer. |
申请公布号 |
US9142622(B2) |
申请公布日期 |
2015.09.22 |
申请号 |
US201314091808 |
申请日期 |
2013.11.27 |
申请人 |
Seoul Viosys Co., Ltd. |
发明人 |
Kwak Woo Chul;Choi Seung Kyu;Song Jae Hoon;Kim Chae Hon;Jung Jung Whan |
分类号 |
H01L21/02;H01L29/20;C30B25/20;C30B29/40 |
主分类号 |
H01L21/02 |
代理机构 |
H.C. Park & Associates, PLC |
代理人 |
H.C. Park & Associates, PLC |
主权项 |
1. A nitride semiconductor device, comprising:
a gallium nitride substrate comprising non-defect regions, a first defect region disposed between the non-defect regions, and a second defect region extending from the first defect region; a gallium nitride-based defect dispersion suppressing layer disposed on the gallium nitride substrate, and a gallium nitride semiconductor layer disposed on the defect dispersion suppressing layer, wherein a width of the second defect region on a surface of the gallium nitride semiconductor layer does not exceed two times a width of the first defect region, wherein the gallium nitride substrate comprises a semi-polar or non-polar substrate, and the non-defect regions comprise different off-angles with respect to a [0001] direction. |
地址 |
Ansan-si KR |