发明名称 Method of growing nitride semiconductor layer, nitride semiconductor device, and method of fabricating the same
摘要 Exemplary embodiments of the present invention provide a method of growing a nitride semiconductor layer including growing a gallium nitride-based defect dispersion suppressing layer on a gallium nitride substrate including non-defect regions and a defect region disposed between the non-defect regions, and growing a gallium nitride semiconductor layer on the defect dispersion suppressing layer.
申请公布号 US9142622(B2) 申请公布日期 2015.09.22
申请号 US201314091808 申请日期 2013.11.27
申请人 Seoul Viosys Co., Ltd. 发明人 Kwak Woo Chul;Choi Seung Kyu;Song Jae Hoon;Kim Chae Hon;Jung Jung Whan
分类号 H01L21/02;H01L29/20;C30B25/20;C30B29/40 主分类号 H01L21/02
代理机构 H.C. Park & Associates, PLC 代理人 H.C. Park & Associates, PLC
主权项 1. A nitride semiconductor device, comprising: a gallium nitride substrate comprising non-defect regions, a first defect region disposed between the non-defect regions, and a second defect region extending from the first defect region; a gallium nitride-based defect dispersion suppressing layer disposed on the gallium nitride substrate, and a gallium nitride semiconductor layer disposed on the defect dispersion suppressing layer, wherein a width of the second defect region on a surface of the gallium nitride semiconductor layer does not exceed two times a width of the first defect region, wherein the gallium nitride substrate comprises a semi-polar or non-polar substrate, and the non-defect regions comprise different off-angles with respect to a [0001] direction.
地址 Ansan-si KR