发明名称 TESTING SYSTEM OF THE DEVICE WITH FREE-FORM SURFACE OR 3 DIMENSIONAL FORM AND OPERATING METHOD FOR THE TESTING SYSTEM
摘要 The present invention discloses an inspecting system which can inspect an object to be inspected having a free-form surface or a three dimensional form in a shot time with flexible inspecting freedom degree and an operating method of the inspecting system. The inspecting system according to the present invention comprises a module for acquiring multiple images, a driving unit and a processor, the operating method of the inspecting system according to the present invention is a method for operating the inspecting system described in fig. 2 and claim 1 and performs the following steps of: setting up inspection conditions; acquiring basic images; acquiring final images and inspecting.
申请公布号 KR20150106579(A) 申请公布日期 2015.09.22
申请号 KR20140028803 申请日期 2014.03.12
申请人 MINSEYE CO., LTD. 发明人 CHOI, SANG JIN;SEO, JEONG HWA;KIM, DAE HYUN
分类号 G01N21/95 主分类号 G01N21/95
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