发明名称 |
Integrated circuits and methods for fabricating integrated circuits with silicide contacts on non-planar structures |
摘要 |
Integrated circuits and methods for fabricating integrated circuits are provided. In an embodiment, a method for fabricating an integrated circuit includes providing a semiconductor substrate and forming fins over the semiconductor substrate. Each fin is formed with sidewalls. The method further includes conformally depositing a metal film stack on the sidewalls of each fin. In the method, the metal film stack is annealed to form a metal silicide film over the sidewalls of each fin. |
申请公布号 |
US9142633(B2) |
申请公布日期 |
2015.09.22 |
申请号 |
US201213714049 |
申请日期 |
2012.12.13 |
申请人 |
GLOBALFOUNDRIES, INC. |
发明人 |
Besser Paul R.;Raymond Mark V.;Arunachalam Valli;Kim Hoon |
分类号 |
H01L21/283;H01L29/49;H01L21/285;H01L29/417;H01L29/66;H01L29/78 |
主分类号 |
H01L21/283 |
代理机构 |
Ingrassia Fisher & Lorenz, P.C. |
代理人 |
Ingrassia Fisher & Lorenz, P.C. |
主权项 |
1. A method for fabricating an integrated circuit comprising:
providing a semiconductor substrate; forming fins over the semiconductor substrate, wherein each fin is formed from semiconductor material, and wherein the semiconductor material of each fin has sidewalls; forming a silicon layer on the sidewalls of each fin; conformally depositing a metal film on the sidewalls of the semiconductor material of each fin; and annealing the metal film to form a metal silicide film on the sidewalls of the semiconductor material of each fin, wherein formation of the metal silicide film consumes all of the silicon layer. |
地址 |
Grand Cayman KY |