发明名称 Integrated circuits and methods for fabricating integrated circuits with silicide contacts on non-planar structures
摘要 Integrated circuits and methods for fabricating integrated circuits are provided. In an embodiment, a method for fabricating an integrated circuit includes providing a semiconductor substrate and forming fins over the semiconductor substrate. Each fin is formed with sidewalls. The method further includes conformally depositing a metal film stack on the sidewalls of each fin. In the method, the metal film stack is annealed to form a metal silicide film over the sidewalls of each fin.
申请公布号 US9142633(B2) 申请公布日期 2015.09.22
申请号 US201213714049 申请日期 2012.12.13
申请人 GLOBALFOUNDRIES, INC. 发明人 Besser Paul R.;Raymond Mark V.;Arunachalam Valli;Kim Hoon
分类号 H01L21/283;H01L29/49;H01L21/285;H01L29/417;H01L29/66;H01L29/78 主分类号 H01L21/283
代理机构 Ingrassia Fisher & Lorenz, P.C. 代理人 Ingrassia Fisher & Lorenz, P.C.
主权项 1. A method for fabricating an integrated circuit comprising: providing a semiconductor substrate; forming fins over the semiconductor substrate, wherein each fin is formed from semiconductor material, and wherein the semiconductor material of each fin has sidewalls; forming a silicon layer on the sidewalls of each fin; conformally depositing a metal film on the sidewalls of the semiconductor material of each fin; and annealing the metal film to form a metal silicide film on the sidewalls of the semiconductor material of each fin, wherein formation of the metal silicide film consumes all of the silicon layer.
地址 Grand Cayman KY