发明名称 System and method for ranking anomalies
摘要 Probable anomalies associated with at least one data metric may be detected across a series of windows of time series data by comparison of data to a threshold. An estimated probability of anomalies for each of the windows of time series data may be determined based on the detected probable anomalies and the threshold. The windows of time series data may be ranked based on the estimated probabilities. Probable anomalies associated with highest ranked windows of time series data may be output to a user.
申请公布号 US9141914(B2) 申请公布日期 2015.09.22
申请号 US201113286150 申请日期 2011.10.31
申请人 Hewlett-Packard Development Company, L.P. 发明人 Viswanathan Krishnamurthy;Lakshminarayan Choudur;Satterfield Wade J.;Talwar Vanish;Wang Chengwei
分类号 G06N99/00 主分类号 G06N99/00
代理机构 Van Cott, Bagley, Cornwall & McCarthy 代理人 Van Cott, Bagley, Cornwall & McCarthy
主权项 1. A method comprising, with a number of processors: detecting, across a plurality of windows of time series data, probable anomalies associated with at least one data metric by comparison of data samples within the windows of time series data to a threshold; determining an estimated probability of anomalies for each of a number of most recent windows of time series data for each of a plurality of monitored time series based on the detected probable anomalies and the threshold; and ranking the windows of time series data based on the estimated probabilities for each of the number of most recent windows of time series data.
地址 Houston TX US