| 发明名称 | Infrared ray detector and method of detecting infrared rays by using the same | ||
| 摘要 | A infrared ray detector includes a first metal layer; a second metal layer on the first metal layer and configured to absorb infrared rays; a thermistor layer below the second metal layer, the thermistor layer having a resistance that changes according to infrared rays absorbed in the second metal layer; a thermal leg below the thermistor layer and separated from the first metal layer; and a control unit configured to control a gap between the first metal layer and the thermal leg. | ||
| 申请公布号 | US9140611(B2) | 申请公布日期 | 2015.09.22 |
| 申请号 | US201213568628 | 申请日期 | 2012.08.07 |
| 申请人 | SAMSUNG ELECTRONICS CO., LTD. | 发明人 | Park Hae-seok;Nam Sung-hyun |
| 分类号 | G01J5/20;G01J5/08;G01J5/02 | 主分类号 | G01J5/20 |
| 代理机构 | Harness, Dickey & Pierce, P.L.C. | 代理人 | Harness, Dickey & Pierce, P.L.C. |
| 主权项 | 1. An infrared ray detector comprising: a first metal layer; a second metal layer on the first metal layer and configured to absorb infrared rays; a thermistor layer below the second metal layer, the thermistor layer having a resistance that changes according to infrared rays absorbed in the second metal layer; a bendable thermal leg below the thermistor layer and separated from the first metal layer; and a control unit configured to control a size of a gap between the first metal layer and the thermal leg by bending the thermal leg. | ||
| 地址 | Gyeonggi-Do KR | ||