发明名称 |
Bad block reconfiguration in nonvolatile memory |
摘要 |
When a bad block is found in a nonvolatile memory array, the block is marked as a bad block so that it is not subsequently used. The block is also reconfigured as a bad block by increasing resistance of vertical NAND strings in the block by increasing threshold voltage of at least some transistors along vertical NAND strings, for example, select transistors or memory cell transistors. |
申请公布号 |
US9142324(B2) |
申请公布日期 |
2015.09.22 |
申请号 |
US201314016785 |
申请日期 |
2013.09.03 |
申请人 |
SanDisk Technologies Inc. |
发明人 |
Raghu Deepak;Dusija Gautam;Avila Chris;Dong Yingda;Mui Man |
分类号 |
G11C29/00;G11C29/50;G11C16/10;G11C16/04;G11C29/44 |
主分类号 |
G11C29/00 |
代理机构 |
Davis Wright Tremaine LLP |
代理人 |
Davis Wright Tremaine LLP |
主权项 |
1. A method of operating a plurality of blocks of a block-erasable nonvolatile memory array comprising:
identifying a block of the plurality of blocks as a bad block; in response to identifying the block as a bad block, recording location information for the bad block to thereby prevent any subsequent storage of host data in the bad block; and in response to identifying the block as a bad block, performing a reconfiguration of the block as a bad block by increasing threshold voltage of at least one transistor of the block. |
地址 |
Plano TX US |