发明名称 |
Selecting memory cells using source lines |
摘要 |
A memory device comprises memory cells arranged in rows and columns, and source lines associated with memory sections, each of which includes a plurality of memory cells. Source terminals of transistors included in the memory cells in a first memory section are physically coupled to a first source line that is distinct from other source lines associated with other memory sections on a same row of the memory device as the first memory section. Gate terminals of transistors included in memory cells in a row share a common wordline configured for providing a signal to the gate terminals. |
申请公布号 |
US9142306(B2) |
申请公布日期 |
2015.09.22 |
申请号 |
US201313921567 |
申请日期 |
2013.06.19 |
申请人 |
Atmel Corporation |
发明人 |
Wu Tsung-Ching;Chern Geeng-Chuan;Schumann Steven;Ng Philip S. |
分类号 |
G11C16/16;G11C16/14;G11C16/04 |
主分类号 |
G11C16/16 |
代理机构 |
Fish & Richardson P.C. |
代理人 |
Fish & Richardson P.C. |
主权项 |
1. A memory device comprising:
memory cells arranged in rows and columns; and source lines associated with memory sections, wherein a memory section includes a plurality of memory cells, wherein source terminals of transistors included in the memory cells in a first memory section are physically coupled to a first source line that is distinct from other source lines associated with other memory sections on a same row of the memory device as the first memory section, wherein for an erase operation of the first memory section:
the first source line is configured to provide a first voltage while source lines for the other memory sections on the same row are configured to provide a second voltage that is different from the first voltage, anda wordline and a sense gate line corresponding to the first memory section are configured to provide non-zero voltages while wordlines and sense gate lines corresponding to memory sections in other rows are configured to provide zero voltage. |
地址 |
San Jose CA US |