发明名称 VTFT formation using selective area deposition
摘要 A method of producing a vertical transistor includes providing a conductive gate structure having a reentrant profile on a substrate. A conformal insulating material layer is formed on the conductive gate structure. A conformal semiconductor material layer is formed on the insulating material layer. A deposition inhibiting material is deposited over a portion of the substrate and the conductive gate structure including filling the reentrant profile. A portion of the deposition inhibiting material is removed without removing all of the deposition inhibiting material from the reentrant profile. A plurality of electrodes is formed by depositing an electrically conductive material layer on portions of the semiconductor material layer using a selective area deposition process in which the electrically conductive material layer is not deposited on the deposition inhibiting material remaining in the reentrant profile.
申请公布号 US9142647(B1) 申请公布日期 2015.09.22
申请号 US201414198636 申请日期 2014.03.06
申请人 EASTMAN KODAK COMPANY 发明人 Nelson Shelby Forrester;Ellinger Carolyn Rae
分类号 H01L21/44;H01L29/66;H01L21/28 主分类号 H01L21/44
代理机构 代理人 Zimmerli William R.
主权项 1. A method of producing a vertical transistor comprising: providing a conductive gate structure having a reentrant profile on a substrate; forming a conformal insulating material layer on the conductive gate structure; forming a conformal semiconductor material layer on the insulating material layer; depositing a deposition inhibiting material over a portion of the substrate and the conductive gate structure including filling the reentrant profile; removing a portion of the deposition inhibiting material without removing all of the deposition inhibiting material from the reentrant profile; and forming a plurality of electrodes by depositing an electrically conductive material layer on portions of the semiconductor material layer using a selective area deposition process in which the electrically conductive material layer is not deposited on the deposition inhibiting material remaining in the reentrant profile.
地址 Rochester NY US