发明名称 |
VTFT formation using selective area deposition |
摘要 |
A method of producing a vertical transistor includes providing a conductive gate structure having a reentrant profile on a substrate. A conformal insulating material layer is formed on the conductive gate structure. A conformal semiconductor material layer is formed on the insulating material layer. A deposition inhibiting material is deposited over a portion of the substrate and the conductive gate structure including filling the reentrant profile. A portion of the deposition inhibiting material is removed without removing all of the deposition inhibiting material from the reentrant profile. A plurality of electrodes is formed by depositing an electrically conductive material layer on portions of the semiconductor material layer using a selective area deposition process in which the electrically conductive material layer is not deposited on the deposition inhibiting material remaining in the reentrant profile. |
申请公布号 |
US9142647(B1) |
申请公布日期 |
2015.09.22 |
申请号 |
US201414198636 |
申请日期 |
2014.03.06 |
申请人 |
EASTMAN KODAK COMPANY |
发明人 |
Nelson Shelby Forrester;Ellinger Carolyn Rae |
分类号 |
H01L21/44;H01L29/66;H01L21/28 |
主分类号 |
H01L21/44 |
代理机构 |
|
代理人 |
Zimmerli William R. |
主权项 |
1. A method of producing a vertical transistor comprising:
providing a conductive gate structure having a reentrant profile on a substrate; forming a conformal insulating material layer on the conductive gate structure; forming a conformal semiconductor material layer on the insulating material layer; depositing a deposition inhibiting material over a portion of the substrate and the conductive gate structure including filling the reentrant profile; removing a portion of the deposition inhibiting material without removing all of the deposition inhibiting material from the reentrant profile; and forming a plurality of electrodes by depositing an electrically conductive material layer on portions of the semiconductor material layer using a selective area deposition process in which the electrically conductive material layer is not deposited on the deposition inhibiting material remaining in the reentrant profile. |
地址 |
Rochester NY US |