| 主权项 |
1. A test apparatus for testing a plurality of devices under test, comprising:
a plurality of test heads for retaining therein at least one test board to test devices under test; a connecting section mounted on upper surfaces of the plurality of test heads and independently fixed to each of the plurality of test heads; and a DUT board on which the plurality of devices under test are mounted, the DUT board being mounted to the connecting section, wherein the at least one test board is mountable and removable through a side surface of each of the plurality of test heads while the connecting section is mounted to the test head, at least one of the plurality of test heads includes: a casing that has, on one side surface, an opening for inserting and removing the at least one test board, and retains the at least one test board with an upper side of the at least one test board oriented towards the upper surface; and a mounting member that guides a lower side of the at least one test board through the opening to a pre-set position, and applies an upward force to the lower side of the at least one test board, thereby mounting the at least one test board onto the casing, the at least one test board has, on an upper side, board connectors to exchange signals with the plurality of devices under test, the casing has test-head connectors on the upper surface in positions corresponding to the board connectors when the at least one test board has moved to a pre-set position, the mounting member mounts the board connectors of the at least one test board to the test-head connectors on the upper surface of the casing, and the mounting member includes: a board supporting section that guides the lower side of the at least one test board through the opening to a pre-set position, and supports the lower side of the at least one test board from below; and a lever section that supports the board supporting section and pushes up the board supporting section by means of a force applied from outside the casing. |
