发明名称 NOVEL METHODOLOGY TO AVOID GATE STRESS FOR LOW VOLTAGE DEVICES IN FDSOI TECHNOLOGY
摘要 An inverter is implemented in an FDSOI integrated circuit die. The inverter includes a PMOS transistor and an NMOS transistor. The PMOS and NMOS transistors each include a first gate coupled to the respective source terminal of the transistor. The PMOS and NMOS transistors each include a back gate coupled to the input of the inverter.
申请公布号 US2015263726(A1) 申请公布日期 2015.09.17
申请号 US201414216701 申请日期 2014.03.17
申请人 STMicroelectronics International N.V. 发明人 AGRAWAL Ankit
分类号 H03K17/687;H01L27/12;H01L29/10;H01L29/423;H03K17/10;H01L27/092 主分类号 H03K17/687
代理机构 代理人
主权项 1. A device comprising: a first semiconductor substrate; a dielectric layer on the first semiconductor substrate; a second semiconductor substrate on the dielectric layer and separated from the first semiconductor substrate by the dielectric layer; a gate dielectric layer on the second semiconductor substrate; a plurality of transistors each respectively including: a gate terminal on the gate dielectric layer and separated from the second semiconductor substrate by the gate dielectric layer;a channel region in the second semiconductor substrate below the gate terminal; anda source and drain region in the second semiconductor substrate, the source and the gate terminal being electrically connected; a voltage source coupled to the first semiconductor substrate and configured to turn the plurality of transistors on or off by applying a high voltage or a low voltage to the first semiconductor substrate.
地址 Amsterdam NL