METHOD FOR TESTING INTEGRATED CIRCUIT AND INTEGRATED CIRCUIT CONFIGURED TO FACILITATE PERFORMING SUCH A METHOD

摘要

An integrated circuit, such as for example an application specific integrated circuit, as well as a method of testing such a circuit, are disclosed herein. In one example embodiment, the integrated circuit includes a plurality of pins including a power pin, a ground pin, and a first communication pin, a test mode circuit, and a communication circuit. The integrated circuit additionally includes a first switch connected to the first communication pin, where the first switch is configured to couple the first communication pin to either the test mode circuit or the communication circuit. The integrated circuit further includes a control circuit coupled to the first switch and configured to control whether the first switch is operated to couple the first communication pin to the test mode circuit or to the communication circuit based upon or in response to an operating mode.

主权项

1. An integrated circuit comprising:
a plurality of pins including a power pin, a ground pin, and a first communication pin; a first test mode circuit; a first communication circuit; a first switch connected to the first communication pin, wherein the first switch is configured to couple the first communication pin to either the first test mode circuit or the first communication circuit, wherein the first switch is configured so that the first communication pin can only be coupled to one of the first test mode circuit and the first communication circuit at a first time; and a control circuit, coupled to the first switch, and configured to control whether the first switch is operated to couple the first communication pin to the first test mode circuit or to the first communication circuit based upon or in response to an operating mode of the integrated circuit.