| 发明名称 |
METHOD OF DETECTING DEFECTS IN AN OBJECT BASED ON ACTIVE THERMOGRAPHY AND A SYSTEM THEREOF |
| 摘要 |
There is provided a method of detecting defects in an object based on active thermography, the method including heating a surface of the object at a plurality of localized regions thereof, selecting at least one of the localized regions as a reference region, selecting at least another one of the localized regions as a comparison region, comparing a thermal response at the comparison region to a thermal response at the reference region due to the heating, and determining whether the object has a defect based on the comparison. There is also provided a corresponding system for detecting defects in an object. |
| 申请公布号 |
US2015260667(A1) |
申请公布日期 |
2015.09.17 |
| 申请号 |
US201514645636 |
申请日期 |
2015.03.12 |
| 申请人 |
Agency for Science, Technology and Research |
发明人 |
Isakov Dmitry;Lee Khee Aik Christopher |
| 分类号 |
G01N25/72 |
主分类号 |
G01N25/72 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of detecting defects in an object based on active thermography, the method comprising:
heating a surface of the object at a plurality of localized regions thereof; selecting at least one of the localized regions as a reference region; selecting at least another one of the localized regions as a comparison region; comparing a thermal response at the comparison region to a thermal response at the reference region due to said heating; and determining whether the object has a defect based on the comparison. |
| 地址 |
Singapore SG |
