SEMICONDUCTOR DEVICE AND ELECTRONIC CONTROL DEVICE

摘要

To suppress detection accuracy of a measurement resistance from decreasing by an on-resistance of a selector switch. The selector switch is provided between a first node coupled to a first voltage through a reference resistance and multiple second nodes coupled to the second voltage through measurement resistances, and selects the second node to be coupled to the first node with the selector switch. A correction circuit generates a voltage obtained by adding the second voltage to a voltage between the second node and the first node as a correction voltage. A double integral ADC finds a first integral time elapsed when a difference voltage of the correction voltage to a voltage of the first node is integrated to the first voltage and a second integral time elapsed when the difference voltage of the first voltage to the voltage of the first node is integrated to the correction voltage.

主权项

1. An analog-to-digital conversion circuit configured to output a digital value of an input voltage by comparing the input voltage with a reference voltage, the analog-to-digital conversion circuit comprising:
an internal terminal configured to receive the input voltage; a reference terminal configured to receive the reference voltage; and an integrator circuit configured to integrate a voltage difference between the input voltage and the reference voltage, wherein the reference voltage is variable.