发明名称 FinFET Devices with Unique Fin Shape and the Fabrication Thereof
摘要 A semiconductor device includes a PMOS FinFET and an NMOS FinFET. The PMOS FinFET includes a substrate, a silicon germanium layer disposed over the substrate, a silicon layer disposed over the silicon germanium layer, and a PMOS fin disposed over the silicon layer. The PMOS fin contains silicon germanium. The NMOS FinFET includes the substrate, a silicon germanium oxide layer disposed over the substrate, a silicon oxide layer disposed over the silicon germanium oxide layer, and an NMOS fin disposed over the silicon oxide layer. The NMOS fin contains silicon. The silicon germanium oxide layer and the silicon oxide layer collectively define a concave recess in a horizontal direction. The concave recess is partially disposed below the NMOS fin.
申请公布号 US2015263003(A1) 申请公布日期 2015.09.17
申请号 US201414207848 申请日期 2014.03.13
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 Lee Yi-Jing;Wu Cheng-Hsien;Ko Chih-Hsin;Wann Clement Hsingjen
分类号 H01L27/092;H01L21/8238;H01L21/84;H01L27/12 主分类号 H01L27/092
代理机构 代理人
主权项 1. A semiconductor device, comprising: a substrate; a dielectric layer disposed over the substrate; and a fin structure disposed over the dielectric layer; wherein: the fin structure contains a semiconductor material; and the dielectric layer disposed below the fin structure includes a lateral recess.
地址 Hsin-Chu TW