发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 According to one embodiment, a semiconductor device includes a first semiconductor layer, a first electrode provided on the first semiconductor layer, and a second electrode provided on the first semiconductor layer. The second electrode is apart from the first electrode in a second direction crossing a first direction from the first semiconductor layer toward the first electrode. The first electrode includes a first electrode layer and a second electrode layer. The first electrode layer includes a first metal. The second electrode layer is provided between the first electrode layer and the first semiconductor layer, and includes a second metal. The second metal has a melting point lower than a melting point of the first metal. A distance along the second direction between the first electrode layer and the second electrode is shorter than a distance along the second direction between the second electrode layer and the second electrode.
申请公布号 US2015262819(A1) 申请公布日期 2015.09.17
申请号 US201414476454 申请日期 2014.09.03
申请人 Kabushiki Kaisha Toshiba 发明人 Motai Takako
分类号 H01L21/02;H01L29/205;H01L29/778;H01L29/78;H01L29/66 主分类号 H01L21/02
代理机构 代理人
主权项 1. A semiconductor device comprising: a first semiconductor layer; a first electrode provided on the first semiconductor layer; and a second electrode provided on the first semiconductor layer, the second electrode being apart from the first electrode in a second direction, the second direction crossing a first direction from the first semiconductor layer toward the first electrode, the first electrode including a first electrode layer including a first metal, anda second electrode layer provided between the first electrode layer and the first semiconductor layer, the second electrode layer including a second metal, the second metal having a melting point lower than a melting point of the first metal, a first distance along the second direction between the first electrode layer and the second electrode being shorter than a distance along the second direction between the second electrode layer and the second electrode.
地址 Tokyo JP