发明名称 COMPOSITION FOR TUNGSTEN CMP
摘要 A chemical mechanical polishing composition for polishing a substrate having a tungsten layer includes a water based liquid carrier, a colloidal silica abrasive dispersed in the liquid carrier and having a permanent positive charge of at least 6 mV, and a polycationic amine compound in solution in the liquid carrier. A method for chemical mechanical polishing a substrate including a tungsten layer includes contacting the substrate with the above described polishing composition, moving the polishing composition relative to the substrate, and abrading the substrate to remove a portion of the tungsten from the substrate and thereby polish the substrate.
申请公布号 US2015259573(A1) 申请公布日期 2015.09.17
申请号 US201414203647 申请日期 2014.03.11
申请人 Cabot Microelectronics Corporation 发明人 GRUMBINE Steven;DYSARD Jeffrey;FU Lin;WARD William;WHITENER Glenn
分类号 C09G1/02;H01L21/306 主分类号 C09G1/02
代理机构 代理人
主权项 1. A chemical mechanical polishing composition comprising: a water based liquid carrier; a colloidal silica abrasive dispersed in the liquid carrier, the colloidal silica abrasive having a permanent positive charge of at least 6 mV; and a polycationic amine compound in solution in the liquid carrier.
地址 Aurora IL US