发明名称 |
CMOS IMAGE SENSOR WITH BACKSIDE BIASED SUBSTRATE |
摘要 |
A CMOS image sensor 101 comprises an active layer 11 of a first conductivity type arranged to be reversed biased and a pixel 20 comprising a photosensitive element comprising a well 22 of a second conductivity type and a well 21 of the first conductivity type containing active CMOS elements for reading and resetting the photosensitive element. The CMOS image sensor further comprises a doped buried layer 111 of the second conductivity type in the active layer beneath the well of the first conductivity type. The buried layer is arranged to extend a depletion region below the well of the second conductivity type also below the well of the first conductivity type. |
申请公布号 |
US2015263058(A1) |
申请公布日期 |
2015.09.17 |
申请号 |
US201514645728 |
申请日期 |
2015.03.12 |
申请人 |
E2V Technologies (UK) Limited |
发明人 |
Konstantin Stefanov |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A CMOS image sensor comprising:
an active layer of a first conductivity type arranged to be reversed biased and a pixel comprising: a photosensitive element comprising a well of a second conductivity type; and a well of the first conductivity type containing active CMOS elements for reading and resetting the photosensitive element; anda doped buried layer of the second conductivity type in the active layer beneath the well of the first conductivity type arranged to extend a depletion region below the well of the second conductivity type also below the well of the first conductivity type to form an extended depletion region in the active layer;wherein the extended depletion area in the active layer is arranged to pinch off a parasitic current path between the well of the first conductivity type containing active CMOS elements and a substrate or backside contact. |
地址 |
Chelmsford GB |