发明名称 CMOS IMAGE SENSOR WITH BACKSIDE BIASED SUBSTRATE
摘要 A CMOS image sensor 101 comprises an active layer 11 of a first conductivity type arranged to be reversed biased and a pixel 20 comprising a photosensitive element comprising a well 22 of a second conductivity type and a well 21 of the first conductivity type containing active CMOS elements for reading and resetting the photosensitive element. The CMOS image sensor further comprises a doped buried layer 111 of the second conductivity type in the active layer beneath the well of the first conductivity type. The buried layer is arranged to extend a depletion region below the well of the second conductivity type also below the well of the first conductivity type.
申请公布号 US2015263058(A1) 申请公布日期 2015.09.17
申请号 US201514645728 申请日期 2015.03.12
申请人 E2V Technologies (UK) Limited 发明人 Konstantin Stefanov
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. A CMOS image sensor comprising: an active layer of a first conductivity type arranged to be reversed biased and a pixel comprising: a photosensitive element comprising a well of a second conductivity type; and a well of the first conductivity type containing active CMOS elements for reading and resetting the photosensitive element; anda doped buried layer of the second conductivity type in the active layer beneath the well of the first conductivity type arranged to extend a depletion region below the well of the second conductivity type also below the well of the first conductivity type to form an extended depletion region in the active layer;wherein the extended depletion area in the active layer is arranged to pinch off a parasitic current path between the well of the first conductivity type containing active CMOS elements and a substrate or backside contact.
地址 Chelmsford GB