发明名称 IMAGING DEVICE
摘要 An imaging device is provided at a lower manufacturing cost. In a light-receiving portion of an imaging device which includes the light-receiving portion, a first transistor connected to the light-receiving portion, and a peripheral circuit, a comb-like n-type semiconductor and a comb-like p-type semiconductor are arranged so as to engage with each other in a plan view. Further, the light-receiving portion and the first transistor overlap with each other. The peripheral circuit includes a second transistor and a third transistor. Further, the second transistor and the third transistor include semiconductor layers having different bandgaps. Further, one of the semiconductor layers of the second transistor and the third transistor has the same bandgap as a semiconductor layer of the first transistor.
申请公布号 US2015263052(A1) 申请公布日期 2015.09.17
申请号 US201514641625 申请日期 2015.03.09
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 YAMAZAKI Shunpei;SAKAKURA Masayuki;KUROKAWA Yoshiyuki
分类号 H01L27/146;H01L29/06 主分类号 H01L27/146
代理机构 代理人
主权项 1. An imaging device comprising: a light-receiving portion; a first transistor; and a first circuit; wherein the light-receiving portion is electrically connected to the first transistor, wherein the first transistor is electrically connected to the first circuit, wherein the light-receiving portion comprises a first region and a second region, wherein the first region and the second region each have a comb-like shape in a plan view, and wherein the first region and the second region are arranged so as to engage with each other.
地址 Atsugi-shi JP