| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a device configured to allow a new test pattern to be generated after designing, and to reduce area scale of a circuit unnecessary during normal operation.SOLUTION: A device includes a first circuit and a second circuit. The second circuit includes a plurality of third circuits, a plurality of fourth circuits, and a fifth circuit. The second circuit has a function of generating a signal for testing an operation state of the first circuit, and a function of operating as a part of the first circuit. The fourth circuits include a function of storing first data, and a function of storing second data. The fifth circuit has a function of writing the first data into the fourth circuits, a function of writing the second data into the fourth circuits, and a function of reading the second data from the fourth circuits.</p> |
