发明名称 METHOD OF FABRICATING SEMICONDUCTOR INTEGRATED CIRCUIT HAVING PHASE-CHANGE LAYER
摘要 A method of fabricating a semiconductor integrated circuit that includes forming a lower electrode in a semiconductor substrate, forming an interlayer insulating layer including a phase-change region exposing the lower electrode on the semiconductor substrate, forming a first phase-change layer having a crystalline state along surfaces of the Interlayer insulating layer and an exposed lower electrode, and growing a second phase-change layer on the first phase-change layer based on the crystallinity of the first phase-change layer to be filled in the phase-change region.
申请公布号 US2015263283(A1) 申请公布日期 2015.09.17
申请号 US201414303333 申请日期 2014.06.12
申请人 SK hynix Inc. 发明人 KANG Se Hun
分类号 H01L45/00;H01L27/24 主分类号 H01L45/00
代理机构 代理人
主权项 1. A method of fabricating a semiconductor integrated circuit, the method comprising: forming a first phase-change layer having a crystalline state; and growing a second phase-change layer on the first phase-change layer based on crystallinity of the first phase-change layer.
地址 Gyeonggi-do KR