发明名称 |
METHOD OF FABRICATING SEMICONDUCTOR INTEGRATED CIRCUIT HAVING PHASE-CHANGE LAYER |
摘要 |
A method of fabricating a semiconductor integrated circuit that includes forming a lower electrode in a semiconductor substrate, forming an interlayer insulating layer including a phase-change region exposing the lower electrode on the semiconductor substrate, forming a first phase-change layer having a crystalline state along surfaces of the Interlayer insulating layer and an exposed lower electrode, and growing a second phase-change layer on the first phase-change layer based on the crystallinity of the first phase-change layer to be filled in the phase-change region. |
申请公布号 |
US2015263283(A1) |
申请公布日期 |
2015.09.17 |
申请号 |
US201414303333 |
申请日期 |
2014.06.12 |
申请人 |
SK hynix Inc. |
发明人 |
KANG Se Hun |
分类号 |
H01L45/00;H01L27/24 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating a semiconductor integrated circuit, the method comprising:
forming a first phase-change layer having a crystalline state; and growing a second phase-change layer on the first phase-change layer based on crystallinity of the first phase-change layer. |
地址 |
Gyeonggi-do KR |