发明名称 PROBE TIP STRUCTURE FOR BONDINGLESS ELECTRONIC LAPPING GUIDE CONNECTIONS
摘要 A lapping system including a substrate having an air bearing surface and at least one slider, wherein each slider comprises at least one electronic lapping guide pad, and a probe card comprising at least one extending probe comprising a body member and a distal end, the probe card being movable in a direction of compression between a first position in which the distal end of a first extending probe is spaced from a top surface of one of a first electronic lapping guide pad and a second position in which the distal end of the first extending probe contacts the top surface the first electronic lapping guide pad, wherein the first extending probe is pre-loaded with a predetermined spring force in the direction of compression.
申请公布号 US2015260757(A1) 申请公布日期 2015.09.17
申请号 US201414216186 申请日期 2014.03.17
申请人 Seagate Technology LLC 发明人 Li Leping;Maytag Kara L.;Keo Saravuth
分类号 G01R1/073;G11B5/31;G01B7/06 主分类号 G01R1/073
代理机构 代理人
主权项 1. A lapping system comprising: a substrate comprising a front surface and at least one slider, wherein each slider comprises at least one electronic lapping guide pad; and a probe card comprising at least one extending probe comprising a body member and a distal end, the probe card being movable in a direction of compression between a first position in which the distal end of a first extending probe is spaced from a top surface of one of a first electronic lapping guide pad and a second position in which the distal end of the first extending probe contacts the top surface the first electronic lapping guide pad, wherein the first extending probe is pre-loaded with a predetermined spring force in the direction of compression.
地址 Cupertino CA US