发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CONTROLLING THE SAME
摘要 A semiconductor memory device according to an embodiment comprises: a nonvolatile memory cell and a control circuit. The control circuit executes: a first write operation that performs a write on the memory cell using a first write voltage; a first verify operation that determines whether a threshold voltage of the memory cell exceeds a first threshold value due to the first write operation, or not; a second verify operation that re-determines on the memory cell that has passed the first verify operation whether the threshold voltage exceeds the first threshold value, or not; and a second write operation that performs a write on the memory cell that has not passed the second verify operation, using a second write voltage.
申请公布号 US2015262679(A1) 申请公布日期 2015.09.17
申请号 US201414457414 申请日期 2014.08.12
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SHIMURA Yasuhiro
分类号 G11C16/10;G11C16/34;G11C16/04 主分类号 G11C16/10
代理机构 代理人
主权项 1. A semiconductor memory device, comprising: a nonvolatile memory cell; and a control circuit that performs write control on the memory cell, the control circuit executing: a first write operation that performs a write on the memory cell using a first write voltage; a first verify operation that determines whether a threshold voltage of the memory cell exceeds a first threshold value due to the first write operation, or not; a second verify operation that re-determines on the memory cell that has passed the first verify operation whether the threshold voltage exceeds the first threshold value, or not; and a second write operation that performs a write on the memory cell that has not passed the second verify operation, using a second write voltage.
地址 Minato-ku JP