发明名称 THIN-FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME
摘要 According to one embodiment, a thin-film transistor comprises an oxide semiconductor layer formed on a part of a substrate, a first gate insulator film of a silicon dioxide film formed on the oxide semiconductor layer and by the CVD method with a silane-based source gas, a second gate insulator film of a silicon dioxide film formed on the first gate insulator film by the CVD method with a TEOS source gas, and a gate electrode formed on the second gate insulator film.
申请公布号 US2015263142(A1) 申请公布日期 2015.09.17
申请号 US201514729117 申请日期 2015.06.03
申请人 Japan Display Inc. 发明人 HIRAMATSU Masato;FUCHI Masayoshi;ISHIDA Arichika
分类号 H01L29/66;H01L21/02;H01L21/465;H01L29/786 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method for manufacturing a thin-film transistor comprising: forming an oxide semiconductor layer on a part of a substrate; forming a first gate insulator film of a silicon dioxide film on the oxide semiconductor layer and the substrate to cover end portions of the oxide semiconductor layer, by the CVD method with a silane-based source gas; forming a second gate insulator film of a silicon dioxide film on the first gate insulator film by the CVD method with a TEOS source gas; and forming a gate electrode on the second gate insulator film.
地址 Minato-ku JP