发明名称 IMAGE PROCESSING APPARATUS AND SOLID-STATE IMAGING APPARATUS
摘要 According to one embodiment, an image processing apparatus includes a defect correcting circuit. The defect correcting circuit includes a defect judging unit, a first correcting unit, and a second correcting unit. The defect judging unit performs defect judgment on a target pixel. The first correcting unit performs replacement of a pixel value of the target pixel detected as a defect based on a result of the defect judgment. The second correcting unit performs an interpolating process of a pixel value on a designated pixel. The designated pixel is the pixel of which positional information is registered in advance as a defect. When the second correcting unit performs the interpolating process, the defect judging unit performs the defect judgment according to the pixel value subjected to the interpolating process.
申请公布号 US2015264285(A1) 申请公布日期 2015.09.17
申请号 US201414444306 申请日期 2014.07.28
申请人 Kabushiki Kaisha Toshiba 发明人 TATSUZAWA Yukiyasu
分类号 H04N5/367;H04N5/3745;H04N5/361 主分类号 H04N5/367
代理机构 代理人
主权项 1. An image processing apparatus in a solid-state imaging apparatus, the image processing apparatus configured to comprise: a defect correcting circuit which performs defect correction on an image signal from an imaging device in the solid-state imaging apparatus, wherein the defect correcting circuit includes a defect judging unit which performs defect judgment on a target pixel based on pixel values of peripheral pixels; a first correcting unit which performs replacement of a pixel value of the target pixel detected as a defect based on a result of the defect judgment; and a second correcting unit which performs an interpolating process of a pixel value on a designated pixel of which positional information is registered in advance as a defect, wherein the target pixel is located on the center of a pixel block in which a plurality of pixels are arranged, the peripheral pixels are included in the pixel block, and when the second correcting unit performs the interpolating process, the defect judging unit performs the defect judgment according to the pixel value subjected to the interpolating process.
地址 Minato-ku JP