发明名称 バリア層の形成方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for forming a barrier layer, by which a barrier layer exhibiting sufficient barrier performance can be formed with satisfactory productivity even when the barrier layer is interposed between conductive layers comprising dissimilar metals. <P>SOLUTION: The method for forming a barrier layer BM includes the steps of: arranging a work piece W with one conductive layer CL1 and a target 2, for example made of Ti, inside a vacuum processing chamber 1a, introducing rare gas in the vacuum processing chamber to form a plasma atmosphere, and sputtering the target to form a first metal layer on a surface of the one conductive layer; introducing gas containing oxygen gas and nitrogen gas in the vacuum processing chamber to form a plasma atmosphere and oxynitriding a surface of the first metal layer while also exposing the target to the plasma atmosphere so that a surface of the target is oxynitrided; and further introducing the rare gas in the vacuum processing chamber to form a plasma atmosphere and sputtering the target to form a second metal layer on the oxynitrided surface. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5780509(B2) 申请公布日期 2015.09.16
申请号 JP20100285943 申请日期 2010.12.22
申请人 发明人
分类号 C23C14/06;C23C14/58;H01L21/28;H01L21/285;H01L21/768 主分类号 C23C14/06
代理机构 代理人
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