发明名称 Trench gate trench field plate semi-vertical semi-lateral MOSFET
摘要 A semiconductor device has a vertical drain extended MOS transistor with deep trench structures to define a vertical drift region and at least one vertical drain contact region, separated from the vertical drift region by at least one instance of the deep trench structures. Dopants are implanted into the vertical drain contact regions and the semiconductor device is annealed so that the implanted dopants diffuse proximate to a bottom of the deep trench structures. The vertical drain contact regions make electrical contact to the proximate vertical drift region at the bottom of the intervening deep trench structure. At least one gate, body region and source region are formed above the drift region at, or proximate to, a top surface of a substrate of the semiconductor device. The deep trench structures are spaced so as to form RESURF regions for the drift region.
申请公布号 US9136368(B2) 申请公布日期 2015.09.15
申请号 US201314044909 申请日期 2013.10.03
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 Denison Marie;Pendharkar Sameer;Mathur Guru
分类号 H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119;H01L29/78;H01L29/66;H01L29/10;H01L29/08 主分类号 H01L29/76
代理机构 代理人 Garner Jacqueline J.;Cimino Frank D.
主权项 1. A semiconductor device, comprising: a substrate comprising a semiconductor having a first conductivity type; and a vertical drain extended metal oxide semiconductor (MOS) transistor, including: a deep trench structure disposed in said substrate, at least one micron deep, having a dielectric liner abutting said substrate; a vertical drain contact region having a second conductivity type opposite from said first conductivity type disposed in said substrate, said vertical drain contact region abutting and being bounded on at least two opposite sides by said deep trench structure, said vertical drain contact region extending below a bottom of said deep trench structure; a vertically oriented drift region having said second conductivity type, disposed in said substrate, laterally separated from said vertical drain contact region by a portion of said deep trench structure, said vertically oriented drift region making electrical contact to said vertical drain contact region proximate to said bottom of said deep trench structure; and a body region having said first conductivity type disposed over said vertically oriented drift region.
地址 Dallas TX US