发明名称 |
Moisture barrier for a wire bond |
摘要 |
An electronic device comprising a bond pad on a substrate and a wire bonded to the bond pad. The device further comprises an intermetallic compound interface located between the bond pad and the wire and a silicon nitride or silicon carbonyl layer covering the intermetallic compound interface. |
申请公布号 |
US9136245(B2) |
申请公布日期 |
2015.09.15 |
申请号 |
US201414283602 |
申请日期 |
2014.05.21 |
申请人 |
Avago Technologies General IP (Singapore) Pte. Ltd |
发明人 |
DeLucca John M.;Weachock Ronald J.;Dutt Barry J.;Baiocchi Frank A.;Osenbach John W. |
分类号 |
H01L23/485;H01L23/00;H01L23/31 |
主分类号 |
H01L23/485 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing an electronic device, comprising:
forming a wire bond, including: providing a bond pad on a substrate; bonding a wire to the bond pad, thereby forming an intermetallic compound interface; and forming a silicon nitride or silicon carbonyl layer that covers an outer surface of the intermetallic compound interface, the silicon carbonyl layer having an elemental formula of Si(CO)n where n=1-4, and the intermetallic compound interface including a first layer adjacent to the wire and a second layer adjacent to the bond pad, the second layer having a larger average grain size than the first layer. |
地址 |
Singapore SG |