发明名称 Semiconductor device and driving method thereof
摘要 A semiconductor device has a non-volatile memory cell including a write transistor which includes an oxide semiconductor and has small leakage current in an off state between a source and a drain, a read transistor including a semiconductor material different from that of the write transistor, and a capacitor. Data is written or rewritten to the memory cell by turning on the write transistor and applying a potential to a node where one of a source electrode and drain electrode of the write transistor, one electrode of the capacitor, and a gate electrode of the read transistor are electrically connected to one another, and then turning off the write transistor so that the predetermined amount of charge is held in the node.
申请公布号 US9136280(B2) 申请公布日期 2015.09.15
申请号 US201414328818 申请日期 2014.07.11
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Furutani Kazuma;Ieda Yoshinori;Yakubo Yuto;Kato Kiyoshi;Yamazaki Shunpei
分类号 H01L27/12;G11C16/04;G11C11/403;H01L27/115 主分类号 H01L27/12
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. A semiconductor device comprising: a first transistor comprising a pair of impurity regions; a first interlayer insulating layer covering at least a portion of the first transistor; a second transistor electrically connected to the first transistor, the second transistor comprising: an oxide semiconductor layer over the first interlayer insulating layer;a gate insulating layer over the oxide semiconductor layer; anda gate electrode over the gate insulating layer; a second interlayer insulating layer over the second transistor; an opening formed through at least the second interlayer insulating layer, the oxide semiconductor layer and the first interlayer insulating layer; and an electrode formed in the opening, wherein the electrode is in contact with the second interlayer insulating layer, wherein the electrode is electrically connected to one of the pair of impurity regions.
地址 Atsugi-shi, Kanagawa-ken JP