发明名称 |
Radiation failure inspecting method and radiation failure inspecting apparatus |
摘要 |
A radiation failure inspecting method includes acquiring read data when a scanner reads a radiation surface of a radiation unit in a state where a reading surface of the scanner faces the radiation surface of the radiation unit and the radiation unit emits light; acquiring a value corresponding to a radiation energy of the light from the radiation unit by integrating the read data in a direction corresponding to a predetermined direction on the read data; and determining that a radiation failure occurs in the radiation unit when the value corresponding to the radiation energy of the light is equal to or less than a threshold value. |
申请公布号 |
US9134173(B2) |
申请公布日期 |
2015.09.15 |
申请号 |
US201213400913 |
申请日期 |
2012.02.21 |
申请人 |
Seiko Epson Corporation |
发明人 |
Nakajima Mikito |
分类号 |
G01J1/02;G01J1/42;G03B27/80 |
主分类号 |
G01J1/02 |
代理机构 |
Workman Nydegger |
代理人 |
Workman Nydegger |
主权项 |
1. A radiation failure inspecting method in a radiation unit including a plurality of radiation sections that each emit light to cure photo-curable ink and are arranged two-dimensionally in a predetermined direction and a direction intersecting the predetermined direction and emitting the light to the photo-curable ink on a medium while being moved in the predetermined direction relative to the medium, the radiation failure inspecting method comprising:
scanning a radiation surface of the radiation unit to acquire red, green, and blue (RGB) data as read data in a state where a reading surface of the scanner faces the radiation surface of the radiation unit and the radiation unit emits the light; integrating the read data in a direction corresponding to the predetermined direction on the read data to acquire a value corresponding to a radiation energy of the light from the radiation unit; and determining that a radiation failure occurs in the radiation unit when the value corresponding to the radiation energy of the light is equal to or less than a threshold value. |
地址 |
Tokyo JP |