发明名称 Radiation failure inspecting method and radiation failure inspecting apparatus
摘要 A radiation failure inspecting method includes acquiring read data when a scanner reads a radiation surface of a radiation unit in a state where a reading surface of the scanner faces the radiation surface of the radiation unit and the radiation unit emits light; acquiring a value corresponding to a radiation energy of the light from the radiation unit by integrating the read data in a direction corresponding to a predetermined direction on the read data; and determining that a radiation failure occurs in the radiation unit when the value corresponding to the radiation energy of the light is equal to or less than a threshold value.
申请公布号 US9134173(B2) 申请公布日期 2015.09.15
申请号 US201213400913 申请日期 2012.02.21
申请人 Seiko Epson Corporation 发明人 Nakajima Mikito
分类号 G01J1/02;G01J1/42;G03B27/80 主分类号 G01J1/02
代理机构 Workman Nydegger 代理人 Workman Nydegger
主权项 1. A radiation failure inspecting method in a radiation unit including a plurality of radiation sections that each emit light to cure photo-curable ink and are arranged two-dimensionally in a predetermined direction and a direction intersecting the predetermined direction and emitting the light to the photo-curable ink on a medium while being moved in the predetermined direction relative to the medium, the radiation failure inspecting method comprising: scanning a radiation surface of the radiation unit to acquire red, green, and blue (RGB) data as read data in a state where a reading surface of the scanner faces the radiation surface of the radiation unit and the radiation unit emits the light; integrating the read data in a direction corresponding to the predetermined direction on the read data to acquire a value corresponding to a radiation energy of the light from the radiation unit; and determining that a radiation failure occurs in the radiation unit when the value corresponding to the radiation energy of the light is equal to or less than a threshold value.
地址 Tokyo JP