发明名称 TABLE APPARATUS, MEASURING APPARATUS, MACHINE TOOL, AND SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 A table apparatus (100) is provided with: a first table (1) having a first upper surface; a second table (2), which is disposed on one side of the first table with respect to the first axis direction parallel to a first axis within a predetermined plane, and which has a second upper surface; a first guide apparatus (3) that guides the first table in the first axis direction; and a second guide apparatus (4) that guides the second table in the first axis direction. The first guide apparatus and the second guide apparatus are disposed in the second axis direction that is parallel to a second axis within the predetermined plane, said second axis being orthogonal to the first axis.
申请公布号 WO2015133436(A1) 申请公布日期 2015.09.11
申请号 WO2015JP56088 申请日期 2015.03.02
申请人 NSK LTD. 发明人 FUJITA, DAISUKE
分类号 B23Q1/01;B23Q1/60;B23Q1/66;G12B5/00;H01L21/027;H01L21/68 主分类号 B23Q1/01
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