发明名称 METHOD FOR CORRECTING MEASUREMENT ERROR AND DEVICE FOR MEASURING ELECTRONIC COMPONENT CHARACTERISTICS
摘要 In the present invention, measurement value differences between measurement jigs are precisely corrected by taking into consideration three factors (transmission path differences, direct wave differences, and non-transmission path differences) causing differences to arise in the measurement value depending on the measurement jig. A likely value is calculated by a maximum likelihood method with regards to all the coefficients of a relative error correction network model (38) derived by postulating the presence of a leak signal directly transmitted between ports for all pairs of ports selected from signal-line ports pertaining to the detection or imposition of a high-frequency signal and non-signal-line ports other than the signal-line ports. The coefficients of a first relative error correction network submodel derived by postulating the presence of a leak signal directly transmitted between ports among all pairs of ports selected from only the signal-line ports, and the coefficients of non-signal-line ports in a second relative error correction network submodel derived by postulating the presence of a signal reflected by the non-signal-line ports are used as the initial values.
申请公布号 WO2015133265(A1) 申请公布日期 2015.09.11
申请号 WO2015JP54337 申请日期 2015.02.17
申请人 MURATA MANUFACTURING CO., LTD. 发明人 MORI TAICHI;KAGEYAMA SATOSHI
分类号 G01R27/28;G01R35/00 主分类号 G01R27/28
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