发明名称 MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND VISION CHIP
摘要 A measurement system (100) is provided with a projection device (102) for projecting first pattern light, which expresses first pattern projection images including first pattern images corresponding to a specific bit in a Gray code obtained by Gray coding projected coordinates defined by a projected coordinate system and second pattern images having the same period as the first pattern images and a different phase than the first pattern images, onto a subject in accordance with a projection sequence mixing the projection of the first and second pattern images, and at least one photography device (101) for photographing the first pattern light projected onto the subject and generating a photographed image.
申请公布号 WO2015133053(A1) 申请公布日期 2015.09.11
申请号 WO2015JP00272 申请日期 2015.01.22
申请人 PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA 发明人 FUCHIKAMI, RYUJI
分类号 G01B11/25 主分类号 G01B11/25
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