发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
Provided is a semiconductor device suitable for miniaturization and higher density. The semiconductor device includes a first transistor, a second transistor overlapping with the first transistor, a capacitor overlapping with the second transistor, and a first wiring electrically connected to the capacitor. The first wiring includes a region overlapping with an electrode of the second transistor. The first transistor, the second transistor, and the capacitor are electrically connected to one another. A channel of the first transistor includes a single crystal semiconductor. A channel of the second transistor includes an oxide semiconductor. |
申请公布号 |
US2015255490(A1) |
申请公布日期 |
2015.09.10 |
申请号 |
US201514638504 |
申请日期 |
2015.03.04 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
MIYAIRI Hidekazu |
分类号 |
H01L27/12;H01L29/786;H01L23/538;H01L29/04;H01L29/24 |
主分类号 |
H01L27/12 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device comprising:
a first transistor; a second transistor overlapping with the first transistor; a first capacitor overlapping with the second transistor; and a first wiring electrically connected to the first capacitor, wherein the first wiring and an electrode of the second transistor overlap each other; wherein the first transistor, the second transistor and the first capacitor are electrically connected to each other, wherein a channel of the first transistor comprises a single crystal semiconductor, and wherein a channel of the second transistor comprises an oxide semiconductor. |
地址 |
Atsugi-shi JP |