发明名称 INTEGRATED CIRCUITS INCLUDING CONTACTS FOR METAL RESISTORS AND METHODS FOR FABRICATING THE SAME
摘要 Integrated circuits and methods for fabricating integrated circuits are provided. In one example, a method for fabricating an integrated circuit includes etching an ILD layer of dielectric material overlying a semiconductor substrate that includes a device region to form first contact vias that expose active areas of the device region. The ILD layer is etched to form second contact vias that correspondingly expose a gate that is disposed in the device region and a patterned resistive metal-containing layer that is disposed in the ILD layer adjacent to the device region. The first contact vias and the second contact vias are filled with an electrically-conductive material to form first contacts that are in electrical communication with the active areas and second contacts that include a gate contact and a metal resistor contact that are in electrical communication with the gate and the patterned resistive metal-containing layer, respectively.
申请公布号 US2015255335(A1) 申请公布日期 2015.09.10
申请号 US201414195932 申请日期 2014.03.04
申请人 GLOBALFOUNDRIES, Inc. 发明人 Beasor Scott;Singh Jagar
分类号 H01L21/768;H01L49/02;H01L23/50;H01L27/06;H01L23/48 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method for fabricating an integrated circuit comprising: etching an ILD layer of dielectric material overlying a semiconductor substrate that comprises a device region to form first contact vias that expose active areas of the device region; etching the ILD layer to form second contact vias that correspondingly expose a gate that is disposed in the device region adjacent to the active areas and a patterned resistive metal-containing layer that is disposed in the ILD layer adjacent to the device region; and filling the first contact vias and the second contact vias with an electrically-conductive material to form first contacts that are in electrical communication with the active areas and second contacts that include a gate contact and a metal resistor contact that are in electrical communication with the gate and the patterned resistive metal-containing layer, respectively.
地址 Grand Cayman KY