发明名称 RESISTANCE VARIABLE MEMORY SENSING
摘要 The present disclosure includes apparatuses and methods for sensing a resistance variable memory cell. A number of embodiments include programming a memory cell to an initial data state and determining a data state of the memory cell by applying a programming signal to the memory cell, the programming signal associated with programming memory cells to a particular data state, and determining whether the data state of the memory cell changes from the initial data state to the particular data state during application of the programming signal.
申请公布号 US2015255152(A1) 申请公布日期 2015.09.10
申请号 US201514717784 申请日期 2015.05.20
申请人 Micron Technology, Inc. 发明人 Bedeschi Ferdinando;Gastaldi Roberto
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项
地址 Boise ID US